Scanning near-field optical microscopy utilizing silicon nitride probe photoluminescence

Applied Physics Letters

Volumn 87, Issue 21, 2005, Pages 1-3

  Lulevich, Valentin ^a   Ducker, William A ^a,b  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

^b UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

DECAY LENGTH; INTENSE LIGHT; LATERAL RESOLUTION; SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM);

ATOMIC FORCE MICROSCOPY; FLUORESCENCE; LIGHT SCATTERING; PHOTOLUMINESCENCE; SAMPLING; SCANNING; SILICON NITRIDE;

OPTICAL MICROSCOPY;

EID: 27844585547     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2136216     Document Type: Article

References (13)

1. D. W. Pohl, W. Denk, and M. Lanz, Appl. Phys. Lett. 44, 651 (1984).
2. E. Betzig and J. K. Troutman, Science 257, 89 (1992).
3. G. Binnig, C. F. Quate, and C. Gerber, Phys. Rev. Lett. 56, 930 (1986).
4. D. Richards, Philos. Trans. R. Soc. London, Ser. A 361, 2843 (2003).
5. S. Kirstein, Curr. Opin. Colloid Interface Sci., 4, 256 (1999).
6. N. F. Vanhulst, N. P. Deboer, and B. Bolger, J. Microsc. 163, 117 (1991).
7. R. Hillenbrand, Ultramicroscopy, 100, 421 (2004).
8. F. Zenhausern, Y. Martin, and H. K. Wickramasinghe, Science 269, 1083 (1995).
9. R. Kopelman, K. Lieberman, A. Lewis, and W. Tan, J. Lumin. 48, 871 (1991).
10. H. Göttlich and W. M. Heckl, Ultramicroscopy, 61, 145 (1995).
11. A. Bouhelier, M. R. Beversluis, and L. Novotny, Ultramicroscopy, 100, 413 (2004).
12. S. Richards, Philos. Trans. R. Soc. London, Ser. A 361, 2843 (2003).
13. J. Azoulay, A. D́barre, A. Richard, and P. Tch́nio, Appl. Opt. 39, 129 (2000).