Beaming effect of optical near-field in multiple metallic slits with nanometric linewidth and micrometer pitch

Optics Communications

Volumn 253, Issue 1-3, 2005, Pages 198-204

  Wei, Pei Kuen ^a   Chou, Hsieh Li ^a   Cheng, You Ren ^a   Wei, Cheng Hung ^b   Fann, Wunshain ^b   Tegenfeldt, Jonas O ^c  

^a RESEARCH CENTER FOR APPLIED SCIENCES   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^c LUND UNIVERSITY   (Sweden)

Author keywords

Near field scanning optical microscopes

Indexed keywords

DIFFRACTION; ELECTRIC FIELDS; FINITE DIFFERENCE METHOD; FLUIDIC DEVICES; LIGHT TRANSMISSION; NANOSTRUCTURED MATERIALS; SURFACES; TIME DOMAIN ANALYSIS;

FRINGE PATTERNS; NANOMETALLIC SLITS; NANOMETRIC METALLIC STRUCTURES; NEAR-FIELD SCANNING OPTICAL MICROSCOPES;

OPTICAL MICROSCOPY;

EID: 23844442826     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2005.04.041     Document Type: Article

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