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Volumn 83, Issue 10, 2006, Pages 1957-1960

Compressed-carbon dioxide (CO2) assisted nanoimprint lithography using polymeric mold

Author keywords

Compressed carbon dioxide; Fluoropolymer; Micro nano patterns; Nanoimprint lithography

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON DIOXIDE; FABRICATION; FLUORINE CONTAINING POLYMERS; GLASS TRANSITION; INTERFACIAL ENERGY; POLYMETHYL METHACRYLATES; PRESSURE EFFECTS; SCANNING ELECTRON MICROSCOPY; THERMAL EFFECTS; COMPRESSIBILITY OF GASES; LITHOGRAPHY; NANOSTRUCTURED MATERIALS;

EID: 33745164622     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2006.02.003     Document Type: Article
Times cited : (8)

References (20)
  • 9
    • 33745153670 scopus 로고    scopus 로고
    • S.Y. Chou, US Patent 6,309,580.
  • 17
    • 0003874971 scopus 로고    scopus 로고
    • Hougham G., Cassidy P.E., John K., and Davidson T. (Eds), Kluwer Academic, New York
    • Resnick P.R., and Buck W.H. In: Hougham G., Cassidy P.E., John K., and Davidson T. (Eds). Fluoropolmers vol. 2 (1999), Kluwer Academic, New York
    • (1999) Fluoropolmers , vol.2
    • Resnick, P.R.1    Buck, W.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.