Synchrotron area diffractometry as a tool for spatial high-resolution three-dimensional lattice misorientation mapping

Journal of Physics D: Applied Physics

Volumn 36, Issue 10 A, 2003, Pages

  Mikulik P ^a   Lubbert D ^b   Korytar D ^a   Pernot, P ^a,c   Baumbach, T ^a  

^a EADQ   (Germany)

^b DESY   (Germany)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; DIFFRACTOMETERS; IMAGE ANALYSIS; SEMICONDUCTING GALLIUM ARSENIDE; SYNCHROTRONS; THREE DIMENSIONAL;

CRYSTAL DIFFRACTION; HIGH RESOLUTION DIFFRACTION IMAGING;

CRYSTAL LATTICES;

EID: 0038282989     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/36/10a/315     Document Type: Article

References (6)

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5. Chrysanthakopoulos N, Calamiotou M, Lorut F and Baruchel J 2001 J. Phys. D 34 A163
6. Jordan A, von Neida A and Caruso R 1984 J. Cryst. Growth 70 555