Defect-oriented testing and defective-part-level prediction

IEEE Design and Test of Computers

Volumn 18, Issue 1, 2001, Pages 31-40

  Dworak, Jennifer ^a   Wicker, Jason D ^a   Lee, Sooryong ^a   Grimaila, Michael R ^a   Mercer, M Ray ^a,d   Butler, Kenneth M ^d,e   Stewart, Bret ^b,f   Wang, Li C ^c  

^a TEXAS A AND M UNIVERSITY   (United States)

^b TEXAS INSTRUMENTS   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d IEEE

^e ASIC Division of Texas Instrument   (United States)

^f ASIC Division of Texas Instrument ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST PATTERN GENERATION; DEFECT LEVEL; DO-RE-ME METHOD; MPG-D MODEL; WILLIAMS-BROWN MODEL;

ALGORITHMS; CALCULATIONS; COMPUTER SIMULATION; FAULT TREE ANALYSIS; LOGIC GATES; MATHEMATICAL MODELS; PROBABILITY;

INTEGRATED CIRCUIT TESTING;

EID: 0035126597     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.902820     Document Type: Article

References (10)

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2. S. Ma, P. France, and E.J. McCluskey, "An Experimental Chip to Evaluate Test Techniques: Experimental Results," Proc. Int'l Test Conf., IEEE CS Press, Los Alamitos, Calif., 1995, pp. 663-672.
3. T.W. Williams and N.C. Brown, "Defect Level as a Function of Fault Coverage," IEEE Trans. Computers, vol. C-30, no. 12, 1981, pp. 987-988.
4. J. Dworak et al., "On the Superiority of DO-RE-ME/MPG-D Over Stuck-at-Based Defective Part Level Prediction," to be published in Proc. 2000 Asian Test Symp., IEEE CS Press, Los Alamitos, Calif., pp. 151-157.
5. DDQ, Functional, and Scan Tests: How Many Fault Coverages Do We Need?" Proc. Int'l Test Conf., IEEE CS Press, Los Alamitos, Calif., 1992, pp. 168-177.
6. M.R. Grimaila et al., "REDO - Random Excitation and Deterministic Observation - First Commercial Experiment," Proc. VLSI Test Symp., IEEE CS Press, Los Alamitos, Calif., 1999, pp. 268-274.
7. J. Dworak et al., "Enhanced DO-RE-ME Based Defect Level Prediction Using Defect Site Aggregation - MPG-D," Proc. Int'l Test Conf., IEEE CS Press, Los Alamitos, Calif., pp. 930-939.
8. Z. Stanojevic et al., "Computer Aided Fault to Defect Mapping (CAFDM) for Defect Diagnosis," Proc. IEEE Int'l Test Conf., IEEE CS Press, Los Alamitos, Calif., 2000, pp. 729-738.
9. S. Ma, I. Shaik, and R.S. Fetherston, "A Comparison of Bridging Fault Simulation Methods," Proc. IEEE Int'l Test Conf., IEEE CS Press, Los Alamitos, Calif., 1999, pp. 587-595.
10. J. Saxena et al., "On Applying Non-Classical Defect Models to Automated Diagnosis," Proc. Int'l Test Conf., IEEE CS Press, Los Alamitos, Calif., 1998, pp. 748-757.