Experimental evaluation of scan tests for bridges

IEEE International Test Conference (TC)

Volumn , Issue , 2002, Pages 509-518

  Chakravarty, Sreejit ^a   Jain, Ankur ^a   Radhakrishnan, Nandakumar ^a   Savage, Eric W ^a   Zachariah, Sujit T ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BRIDGES; COMPUTER SIMULATION; FAILURE ANALYSIS; MATHEMATICAL MODELS;

SCAN BASED TESTING; SINGLE CYCLE SCAN TESTS; STATIC BRIDGE FAULT COVERAGE;

STRUCTURAL ANALYSIS;

EID: 0036443088     PISSN: 10893539     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEST.2002.1041801     Document Type: Article

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