Definitions of the numbers of detections of target faults and their effectiveness in guiding test generation for high defect coverage

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2001, Pages 504-508

  Pomeranz, Irith ^a   Reddy, Sudhakar M ^b  

^a PURDUE UNIVERSITY   (United States)

^b UNIVERSITY OF IOWA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT COVERAGE; HIGH QUALITY TEST; TARGET FAULTS; TEST GENERATIONS; TEST SETS;

EXHIBITIONS; FAULT DETECTION;

TESTING;

EID: 33646923027     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2001.915070     Document Type: Conference Paper

References (8)

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