Stuck-at tuple-detection: a fault model based on stuck-at faults for improved defect coverage

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1998, Pages 289-294

  Pomeranz, I ^a   Reddy, S M ^a  

^a UNIVERSITY OF IOWA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; EFFICIENCY; ELECTRIC FAULT LOCATION; ERROR DETECTION; MATHEMATICAL MODELS;

FAULT MODELS;

INTEGRATED CIRCUIT TESTING;

EID: 0032313243     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)