The concept of constant emission yield in GDOES

Analytical and Bioanalytical Chemistry

Volumn 385, Issue 3, 2006, Pages 568-585

  Bengtson, Arne ^a   Nelis, Thomas ^b,c  

^a SWEREA KIMAB   (Sweden)

^b SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^c Atout and Progrès ^*  (France)

Author keywords

Compositional depth profiling; Emission yield; Glow discharge optical emission spectroscopy

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC POTENTIAL; GLOW DISCHARGES; MATHEMATICAL MODELS; PLASMAS; PRESSURE EFFECTS;

COMPOSITIONAL DEPTH PROFILING; DISCHARGE PRESSURE; EMISSION YIELD; GLOW DISCHARGE OPTICAL EMISSION SPECTROSCOPY;

EMISSION SPECTROSCOPY;

EID: 33646859235     PISSN: 16182642     EISSN: 16182650     Source Type: Journal    
DOI: 10.1007/s00216-006-0412-7     Document Type: Review

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