Near-band-gap dielectric function of Zn1-xMnxSe thin films determined by spectroscopic ellipsometry

Physical Review B - Condensed Matter and Materials Physics

Volumn 70, Issue 4, 2004, Pages

  Kvietkova, J ^a   Daniel, B ^a   Hetterich, M ^a   Schubert, M ^b   Spemann, D ^b   Litvinov, D ^a   Gerthsen, D ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC; GALLIUM; MANGANESE; SELENIUM; ZINC;

ARTICLE; BINDING AFFINITY; ELECTRICITY; ELLIPSOMETRY; ENERGY; FILM; MOLECULAR BIOLOGY; PHOTON; SPECTROSCOPY;

EID: 37649029737     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.045316     Document Type: Article

References (35)

1. See, e.g., M. Klude and D. Hommel, Appl. Phys. Lett. 79, 2523 (2001); H. Ishikura, T. Abe, N. Fukuda, H. Kasada, and K. Ando, ibid. 76, 1069 (2000).
2. See, e.g., M. Klude and D. Hommel, Appl. Phys. Lett. 79, 2523 (2001); H. Ishikura, T. Abe, N. Fukuda, H. Kasada, and K. Ando, ibid. 76, 1069 (2000).
3. H. Babucke, P. Thiele, T. Prasse, M. Rabe, and F. Henneberger, Semicond. Sci. Technol. 13, 200 (1998).
4. See, e.g., B. T. Jonker, Y. D. Park, B. R. Bennett, H. D. Cheong, G. Kioseoglou, and A. Petrou, Phys. Rev. B 62, 8180 (2000).
5. J. K. Furdyna, J. Appl. Phys. 76, R29 (1988).
6. O. Goede and W. Heimbrodt, Phys. Status Solidi B 146, 11 (1988).
7. A. Twardowski, T. Dietl, and M. Demianiuk, Solid State Commun. 48, 845 (1983).
8. K. J. Ma and W. Giriat, Solid State Commun. 60, 927 (1986).
9. J. Stankiewicz and J. R. Fermin, J. Appl. Phys. 63, 3300 (1988).
10. K. J. Ma and W. Giriat, Phys. Status Solidi A 95, K135 (1986).
11. R. B. Bylsma, W. M. Becker, J. Kossut, U. Debska, and D. Yoder-Short, Phys. Rev. B 33, 8207 (1986).
12. S. Adachi and T. Taguchi, Phys. Rev. B 43, 9569 (1991).
13. R. Dahmani, L. Salamanca-Riba, N. V. Nguyen, D. Chandler-Horowitz, and B. T. Jonker, J. Appl. Phys. 76, 514 (1994).
14. C. C. Kim and S. Sivananthan, Phys. Rev. B 53, 1475 (1996).
15. Y. D. Kim, S. L. Cooper, M. V. Klein, and B. T. Jonker, Phys. Rev. B 49, 1732 (1994).
16. W. K. Hung, M. Y. Chern, Y. F. Chen, W. C. Chou, C. S. Yang, C. C. Cheng, and J. L. Shen, Solid State Commun. 120, 311 (2001).
17. F. C. Peins, S. Lee, U. Bindley, and J. K. Furdyna, J. Vac. Sci. Technol. B 18, 1443 (2000).
18. R. M. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1999).
19. D. E. Aspnes, The Accurate Determination of Optical Properties by Ellipsometry, in E. D. Palik, Handbook of Optical Constants of Solids (Academic, New York, 1998) Vol. I, p. 89.
20. G. E. Jellison, Thin Solid Films 313-314, 33 (1998), and references therein. See also G. E. Jellison, "Ellipsometry data analysis", in Handbook of Ellipsometry, edited by G. E. Irene and H. W. Tompkins (Noyes Publictions, City, 2004).
21. G. E. Jellison, Thin Solid Films 313-314, 33 (1998), and references therein. See also G. E. Jellison, "Ellipsometry data analysis", in Handbook of Ellipsometry, edited by G. E. Irene and H. W. Tompkins (Noyes Publictions, City, 2004).
22. C. M. Herzinger, P. G. Snyder, B. Johs, and J. A. Woollam, J. Appl. Phys. 77, 1715 (1995).
23. S. Zollner, Appl. Phys. Lett. 63, 2523 (1993).
24. C. C. Kim, J. W. Garland, H. Abad, and P. M. Raccah, Phys. Rev. B 45, 11749 (1992).
25. C. C. Kim, J. W. Garland, and P. M. Raccah, Phys. Rev. B 47, 1876 (1993).
26. J. W. Garland, C. Kim, H. Abad, and P. M. Raccah, Phys. Rev. B 41, 7602 (1990).
27. S. Adachi, Physical Properties of HI-V Semiconductor Compounds (Wiley, New York, 1992); S. Adachi, T. Kimura, and N. Suzuki, J. Appl. Phys. 74, 3435 (1993).
28. S. Adachi, Physical Properties of HI-V Semiconductor Compounds (Wiley, New York, 1992); S. Adachi, T. Kimura, and N. Suzuki, J. Appl. Phys. 74, 3435 (1993).
29. M. S. Koo, T. J. Kim, M. S. Lee, M. S. Oh, Y. D. Kim, S. D. Yoo, D. E. Aspnes, and B. T. Jonker, Appl. Phys. Lett. 77, 3364 (2000).
30. R. Granger, J. T. Benhlal, O. Ndap, and R. Triboulet, Eur. J. Biochem. 13, 429 (2000).
31. K. Shahzad, D. J. Olego, and C. G. Van de Walle, Phys. Rev. B 38, 1417 (1988).
32. B. H. Lee, J. Appl. Phys. 41, 2984 (1970).
33. M. Hetterich, B. Daniel, C. Klingshirn, P. Pfundstein, D. Litvinov, D. Gerthsen, K. Eichhorn, and D. Speman, Prog. Solid State Chem. 1, 649 (2004).
34. H. Venghaus, Phys. Rev. B 19, 3071 (1979).
35. S. Lee, F. Michl, U. Rössler, M. Dobrowolska, and J. K. Furdyna, Phys. Rev. B 57, 9695 (1998).