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Volumn 37, Issue 8, 2002, Pages 1475-1489

Review: Graphite

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CHEMICAL BONDS; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; ELECTRIC CONDUCTIVITY; FULLERENES; INTERCALATION COMPOUNDS; OXIDATION; PARTIAL PRESSURE; SIGNAL INTERFERENCE; X RAY DIFFRACTION ANALYSIS;

EID: 0037091214     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1014915307738     Document Type: Review
Times cited : (798)

References (188)
  • 24
    • 0008964279 scopus 로고
    • M.S. thesis, Department of Electrical Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA
    • (1971)
    • Heflinger, B.L.1
  • 30
    • 0008964069 scopus 로고
    • Ph.D. thesis, Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, U.S.A
    • (1969)
    • Schroeder, P.R.1
  • 33
    • 0009007569 scopus 로고
    • Ph.D. thesis, Department of Physics, University of Pennsylvania, Philadelphia, PA, USA
    • (1972)
    • Brillson, L.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.