Determination of the nature of molecular bonding in silica from time-dependent dielectric breakdown data

Journal of Applied Physics

Volumn 95, Issue 12, 2004, Pages 8101-8109

  McPherson, J W ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BONDING DISTANCE; DIELECTRIC BREAKDOWN; IONIC BONDING; MOLECULAR BONDING;

ATOMIC PHYSICS; BOUNDARY CONDITIONS; CHEMICAL BONDS; DIELECTRIC MATERIALS; PERMITTIVITY; POTENTIAL ENERGY; QUANTUM THEORY; SILICA;

MOLECULAR DYNAMICS;

EID: 3142563208     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1728288     Document Type: Article

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