Kelvin probe force microscopy using near-field optical tips

Applied Surface Science

Volumn 157, Issue 4, 2000, Pages 256-262

  Shikler, R ^a   Rosenwaks, Y ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; MICROSCOPIC EXAMINATION; VOLTAGE MEASUREMENT;

KELVIN PROBE FORCE MICROSCOPY (KPFM);

OPTICAL SENSORS;

EID: 0033749428     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00536-X     Document Type: Article

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