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Volumn 73, Issue 16, 2006, Pages

Ab initio structural and electronic properties of dangling-bond-free SiOx Ny

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EID: 33646343227     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.73.165213     Document Type: Article
Times cited : (6)

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