Fast interval-valued statistical modeling of interconnect and effective capacitance

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 25, Issue 4, 2006, Pages 710-724

  Ma, James D ^b   Rutenbar, Rob A ^a,b,c,d,e,f  

^a IEEE   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

^c CARNEGIE MELLON UNIVERSITY   (United States)

^d Department of Electrical and Computer Engineering ^*  (United States)

^e Microelectronics Advanced Research Corporation (MARCO)   (Italy)

^f ACM   (United States)

Author keywords

Affine arithmetic; Effective capacitance; Interconnect; Modeling; Statistical analysis

Indexed keywords

AFFINE ARITHMETIC; EFFECTIVE CAPACITANCE; INTERCONNECTS; MODELING;

ALGORITHMS; COMPUTATION THEORY; CORRELATION METHODS; MATHEMATICAL OPERATORS; MONTE CARLO METHODS; PROBABILITY DENSITY FUNCTION;

STATISTICAL METHODS;

EID: 33645656756     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2006.870067     Document Type: Conference Paper

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