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Volumn 504, Issue 1-2, 2006, Pages 45-49

High-thermal-stability (HfO2)1-x(Al2O 3)x film fabricated by dual-beam laser ablation

Author keywords

High k dielectric thin films; Interface; Metal insulator semiconductor structures; Pulse laser deposition

Indexed keywords

CAPACITORS; ELECTRIC PROPERTIES; SILICON; THERMODYNAMIC STABILITY; THIN FILMS;

EID: 33644889342     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.09.037     Document Type: Conference Paper
Times cited : (6)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.