-
1
-
-
0000149005
-
-
H. Lu, W. J. Schaff, J. Hwang, H. Wu, W. Yeo, A. Pharkya, and L. F. Eastman, Appl. Phys. Lett. 77, 2548 (2000).
-
(2000)
Appl. Phys. Lett.
, vol.77
, pp. 2548
-
-
Lu, H.1
Schaff, W.J.2
Hwang, J.3
Wu, H.4
Yeo, W.5
Pharkya, A.6
Eastman, L.F.7
-
2
-
-
0035247846
-
-
Y. Saito, N. Teraguchi, A. Suzuki, T. Akraki, and Y. Nanishi, Jpn. J. Appl. Phys., Part 2 40, L91 (2001).
-
(2001)
Jpn. J. Appl. Phys., Part 2
, vol.40
-
-
Saito, Y.1
Teraguchi, N.2
Suzuki, A.3
Akraki, T.4
Nanishi, Y.5
-
3
-
-
4244203187
-
-
V. Yu. Davydov, A. A. Klochikhin, R. P. Seisyan, V. V. Emtsev, S. V. Ivanov, F. Bechstedt, J. Furthmuller, H. Harima, A. V. Mudryi, J. Aderhold, O. Semchinova, and J. Graul, Phys. Status Solidi B 229, R1 (2002).
-
(2002)
Phys. Status Solidi B
, vol.229
-
-
Davydov, V.Yu.1
Klochikhin, A.A.2
Seisyan, R.P.3
Emtsev, V.V.4
Ivanov, S.V.5
Bechstedt, F.6
Furthmuller, J.7
Harima, H.8
Mudryi, A.V.9
Aderhold, J.10
Semchinova, O.11
Graul, J.12
-
4
-
-
84875089677
-
-
K. Xu, W. Terashima, T. Hata, N. Hashimoto, Y. Ishitani, and A. Yoshikawa, Phys. Status Solidi C 0, 377 (2002).
-
(2002)
Phys. Status Solidi C
, pp. 377
-
-
Xu, K.1
Terashima, W.2
Hata, T.3
Hashimoto, N.4
Ishitani, Y.5
Yoshikawa, A.6
-
5
-
-
79956030105
-
-
J. Wu, W. Walukiewicz, K. M. Yu, J. W. Ager III, E. E. Haller, H. Lu, W. J. Schaff, Y. Saito, and Y. Nanishi, Appl. Phys. Lett. 80, 3967 (2002).
-
(2002)
Appl. Phys. Lett.
, vol.80
, pp. 3967
-
-
Wu, J.1
Walukiewicz, W.2
Yu, K.M.3
Ager J.W. III4
Haller, E.E.5
Lu, H.6
Schaff, W.J.7
Saito, Y.8
Nanishi, Y.9
-
6
-
-
79955992797
-
-
T. Matsuoka, H. Okamoto, M. Nakao, H. Harima, and E. Kurimoto, Appl. Phys. Lett. 81, 1246 (2002).
-
(2002)
Appl. Phys. Lett.
, vol.81
, pp. 1246
-
-
Matsuoka, T.1
Okamoto, H.2
Nakao, M.3
Harima, H.4
Kurimoto, E.5
-
7
-
-
0347609008
-
-
H. Lu, W. J. Schaff, J. Hwang, H. Wu, G. Koley, and L. F. Eastman, Appl. Phys. Lett. 79, 1489 (2001).
-
(2001)
Appl. Phys. Lett.
, vol.79
, pp. 1489
-
-
Lu, H.1
Schaff, W.J.2
Hwang, J.3
Wu, H.4
Koley, G.5
Eastman, L.F.6
-
9
-
-
0036531185
-
-
Y. Saito, T. Yamaguchi, T. Kanazawa, K. Kano, T. Araki, Y. Nanishi, T. Teraguchi, and A. Suzuki, J. Cryst. Growth 237-239, 1017 (2002).
-
(2002)
J. Cryst. Growth
, vol.237-239
, pp. 1017
-
-
Saito, Y.1
Yamaguchi, T.2
Kanazawa, T.3
Kano, K.4
Araki, T.5
Nanishi, Y.6
Teraguchi, T.7
Suzuki, A.8
-
10
-
-
0041401699
-
-
and related references cited in this letter
-
R. M. Feestra, J. E. Northrup, and J. Neugebauer, MRS Internet J. Nitride Semicond. Res. 7, 3 (2002), and related references cited in this letter.
-
(2002)
MRS Internet J. Nitride Semicond. Res.
, vol.7
, pp. 3
-
-
Feestra, R.M.1
Northrup, J.E.2
Neugebauer, J.3
-
11
-
-
0037095150
-
-
D. H. Lim, K. Xu, S. Arima, A. Yoshikawa, and K. Takahashi, J. Appl. Phys. 91, 6461 (2002).
-
(2002)
J. Appl. Phys.
, vol.91
, pp. 6461
-
-
Lim, D.H.1
Xu, K.2
Arima, S.3
Yoshikawa, A.4
Takahashi, K.5
-
12
-
-
0037013499
-
-
and references therein
-
About polarity characterization by CAICISS, please see A. Yoshikawa, and K. Xu, Thin Solid Films 412, 38 (2002), and references therein.
-
(2002)
Thin Solid Films
, vol.412
, pp. 38
-
-
Yoshikawa, A.1
Xu, K.2
-
13
-
-
0034484103
-
-
R. M. Feenstra, Huajie Chen, V. Ramachandran, C. D. Lee, A. R. Smith, J. E. Northrup, T. Zywietz, J. Neugebauer, and D. W. Greve, Surf. Rev. Lett. 7, 601 (2000).
-
(2000)
Surf. Rev. Lett.
, vol.7
, pp. 601
-
-
Feenstra, R.M.1
Chen, H.2
Ramachandran, V.3
Lee, C.D.4
Smith, A.R.5
Northrup, J.E.6
Zywietz, T.7
Neugebauer, J.8
Greve, D.W.9
-
14
-
-
0000264104
-
-
B. Heying, I. Smorchkova, C. Poblenz, C. Elsass, P. Fini, S. Den Baars, U. Mishra, and J. S. Speck, Appl. Phys. Lett. 77, 2885 (2000).
-
(2000)
Appl. Phys. Lett.
, vol.77
, pp. 2885
-
-
Heying, B.1
Smorchkova, I.2
Poblenz, C.3
Elsass, C.4
Fini, P.5
Baars, S.D.6
Mishra, U.7
Speck, J.S.8
-
15
-
-
0041902692
-
A qualitative analysis of surface stoichiometry in GaN MOVPE growth by SE
-
unpublished. Y. Taniyasu and A. Yoshikawa
-
K. Xu, N. Hashimoto, T. Hata, W. Terashima, Y. Ishitani, and A. Yoshikawa (unpublished). A qualitative analysis of surface stoichiometry in GaN MOVPE growth by SE can be seen in Y. Taniyasu and A. Yoshikawa, J. Electron. Mater. 30, 1402 (2001).
-
(2001)
J. Electron. Mater.
, vol.30
, pp. 1402
-
-
Xu, K.1
Hashimoto, N.2
Hata, T.3
Terashima, W.4
Ishitani, Y.5
Yoshikawa, A.6
|