Recent topics in high-Tc superconductive electronics

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 11, 2005, Pages 7735-7749

  Tonouchi, Masayoshi ^a   Fujimaki, Akira ^b   Tanabe, Keiichi ^c,f,g,h,i   Enpuku, Keiji ^d   Nikawa, Kiyoshi ^e,g,j,k,l   Kobayashi, Takeshi ^a  

^a OSAKA UNIVERSITY   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

^c SUPERCONDUCTIVITY RESEARCH LABORATORY   (Japan)

^d KYUSHU UNIVERSITY   (Japan)

^e RENESAS TECHNOLOGY CORP   (Japan)

^f Division of Electronic Devices

^g JAPAN SOCIETY OF APPLIED PHYSICS   (Japan)

^h National Laboratory for High Energy Physics   (Japan)

ⁱ AMERICAN PHYSICAL SOCIETY   (United States)

^j NEC Electronics Corporation ^*

^k IEEE

^l Electron Device Failure Analysis Society (EDFAS)

more..

Author keywords

High Tc SQUID; High Tc superconductive electronics; IC testing; Immunoassay; Interfaced engineered junction; Laser SQUID; Optical vortex manipulation; Sampler; Superconductive photonics; Terahertz radiation

Indexed keywords

INTERFACED ENGINEERED JUNCTION; SUPERCONDUCTIVE ELECTRONICS; SUPERCONDUCTIVE PHOTONICS;

CONTROL SYSTEMS; DIGITAL DEVICES; INTEGRATED CIRCUITS; SEMICONDUCTOR JUNCTIONS; SQUIDS;

SUPERCONDUCTING DEVICES;

EID: 31644433461     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.44.7735     Document Type: Article

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