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Volumn 15, Issue 2 PART I, 2005, Pages 145-148

Vertically-stacked Josephson junctions using YbBa2Cu 3O7-x as a counter electrode for improving uniformity

Author keywords

High temperature superconductors; Josephson junction fabrication; Vertically stacked interface treated junctions; YbBa2Cu 3O7 x

Indexed keywords

COMPOSITION; ELECTRIC CONDUCTANCE; ELECTRIC CURRENTS; ELECTRODES; HIGH TEMPERATURE SUPERCONDUCTORS; MAGNETIC FIELDS; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM BARIUM COPPER OXIDES;

EID: 22144470125     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2005.849719     Document Type: Conference Paper
Times cited : (5)

References (7)
  • 4
    • 2142751162 scopus 로고    scopus 로고
    • Investigation of the electrical properties of vertically stacked interface-treated Josephson junctions
    • April
    • Y. Yoshinaga, S. Izawa, K. Wakita, T. Ito, M. Inoue, A. Fujimaki, and H. Hayakawa, "Investigation of the electrical properties of vertically stacked interface-treated Josephson junctions," Supercond. Sci. Technol., vol. 17, no. 4, pp. 653-656, April 2004.
    • (2004) Supercond. Sci. Technol. , vol.17 , Issue.4 , pp. 653-656
    • Yoshinaga, Y.1    Izawa, S.2    Wakita, K.3    Ito, T.4    Inoue, M.5    Fujimaki, A.6    Hayakawa, H.7
  • 5
    • 0001641119 scopus 로고
    • Inelastic tunneling across thin amorphous films
    • L. I. Glazman and K. A. Matveev, "Inelastic tunneling across thin amorphous films," Sov. Phys. JETP, vol. 67, pp. 1276-1282, 1988.
    • (1988) Sov. Phys. JETP , vol.67 , pp. 1276-1282
    • Glazman, L.I.1    Matveev, K.A.2
  • 7
    • 18744394896 scopus 로고    scopus 로고
    • Identification of different phases in barriers of interface-engineered ramp-edge Josephson junctions: Formation mechanisms and influences on electrical properties
    • Y. Wu, Y. Ishimaru, H. Wakana, S. Adachi, Y. Tarutani, and K. Tanabe, "Identification of different phases in barriers of interface-engineered ramp-edge Josephson junctions: formation mechanisms and influences on electrical properties," J. Appl. Phys, vol. 92, pp. 4571-4577, 2002.
    • (2002) J. Appl. Phys , vol.92 , pp. 4571-4577
    • Wu, Y.1    Ishimaru, Y.2    Wakana, H.3    Adachi, S.4    Tarutani, Y.5    Tanabe, K.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.