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Volumn 71, Issue 17, 1997, Pages 2526-2528

Properties of interface-engineered high Tc Josephson junctions

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DEPOSITION; HIGH TEMPERATURE SUPERCONDUCTORS; INTERFACES (MATERIALS); PLASMA APPLICATIONS; PLASMAS; SUPERCONDUCTING FILMS; SURFACE TREATMENT; THIN FILMS; YTTRIUM COMPOUNDS;

EID: 0031588245     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120107     Document Type: Article
Times cited : (198)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.