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Volumn 71, Issue 17, 1997, Pages 2526-2528
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Properties of interface-engineered high Tc Josephson junctions
a
Conductus Inc
*
(United States)
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
DEPOSITION;
HIGH TEMPERATURE SUPERCONDUCTORS;
INTERFACES (MATERIALS);
PLASMA APPLICATIONS;
PLASMAS;
SUPERCONDUCTING FILMS;
SURFACE TREATMENT;
THIN FILMS;
YTTRIUM COMPOUNDS;
ION MILLING;
LASER DEPOSITION;
MAGNETIC FIELD MODULATION;
PLASMA TREATMENT;
TEMPERATURE DEPENDENCE;
YTTRIUM BARIUM CUPRATES;
JOSEPHSON JUNCTION DEVICES;
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EID: 0031588245
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.120107 Document Type: Article |
Times cited : (198)
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References (21)
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