Identification of different phases in barriers of interface-engineered ramp-edge Josephson junctions: Formation mechanisms and influences on electrical properties

Journal of Applied Physics

Volumn 92, Issue 8, 2002, Pages 4571-4577

  Wu, Y ^a   Ishimaru, Y ^a   Wakana, H ^a   Adachi, S ^a   Tarutani, Y ^a   Tanabe, K ^a  

^a SUPERCONDUCTIVITY RESEARCH LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODE MATERIAL; ETCHING TIME; FORMATION MECHANISM; LA DOPING; PSEUDOCUBIC; RAMP-EDGE JOSEPHSON JUNCTIONS; TRANSMISSION ELECTRON;

CRITICAL CURRENTS; ELECTRODES; GRAIN BOUNDARIES; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRIC PROPERTIES;

EID: 18744394896     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1508427     Document Type: Article

References (21)

1. C. L. Jia, M. I. Faley, U. Poppe, and K. Urban, Appl. Phys. Lett. 67, 3635 (1995). apl APPLAB 0003-6951
2. Y. Huang, K. L. Merkle, B. H. Moeckly, and K. Char, Physica C 314, 36 (1996). phc PHYCE6 0921-4534
3. J. G. Wen, N. Koshizuka, S. Tanaka, T. Satoh, M. Hidaka, and S. Tahara, Appl. Phys. Lett. 75, 2470 (1999). apl APPLAB 0003-6951
4. Y. Wu, Y. Ishimaru, and K. Tanabe, Physica C 366, 51 (2001). phc PHYCE6 0921-4534
5. Y. Soutome, T. Fukazawa, A. Tsukamoto, Y. Tarutani, and K. Takagi, in Advances in Superconductivity XII, edited by T. Yamashita and K. Tanabe (Springer, Tokyo, 2000), p. 990.
6. B. H. Moeckly and K. Char, Appl. Phys. Lett. 71, 2526 (1997). apl APPLAB 0003-6951
7. T. Satoh, M. Hidaka, and S. Tahara, IEEE Trans. Appl. Supercond. 9, 3141 (1999). tas ITASE9 1051-8223
8. A. Fujimaki, K. Kawai, N. Hayashi, M. Horibe, M. Maruyama, and H. Hayakawa, IEEE Trans. Appl. Supercond. 9, 3436 (1999). tas ITASE9 1051-8223
9. S. Adachi, H. Wakana, M. Horibe, N. Inoue, T. Sugano, and K. Tanabe, Physica C (to be published).
10. H. Wakana, S. Adachi, M. Horibe, Y. Ishimaru, O. Horibe, Y. Tarutani, and K. Tanabe, Jpn. J. Appl. Phys., Part 2 41, L239 (2002). jjc JAPLD8 0021-4922
11. Y. Ishimaru, Y. Wu, O. Horibe, H. Tano, T. Suzuki, Y. Tarutani, U. Kawabe, and K. Tanabe, Jpn. J. Appl. Phys., Part 1 41, 1998 (2002). jjb JAPNDE 0021-4922
12. A. Catana, R. F. Broom, J. G. Bednorz, J. Mannhart, and D. G. Schlom, Appl. Phys. Lett. 60, 1016 (1992). apl APPLAB 0003-6951
13. K. Verbist, A. Kuhle, A. L. Vasiliev, Physica C 269, 131 (1996). phc PHYCE6 0921-4534
14. R. D. Shannon, Acta Crystallogr., Sect. A: Cryst. Phys., Diffr., Theor. Gen. Crystallogr. 32, 751 (1976). aca ACACBN 0567-7394
15. G. Kastner, D. Hasse, R. Scholz, H. Koch, F. Ludwig, M. Lorenz, and H. Kittel, Physica C 243, 281 (1995). phc PHYCE6 0921-4534
16. U. S. di Uccio, F. M. Granozio, A. Di Chiara, F. Tafuri, O. I. Lebedev, K. Verbist, G. van Tendeloo, Physica C 321, 162 (1999). phc PHYCE6 0921-4534
17. Y. Matsui, S. Horiuchi, H. Sawa, K. Obara, and J. Akimitsu, Jpn. J. Appl. Phys., Part 2 28, L1555 (1989). jjc JAPLD8 0021-4922
18. C. L. Jia, H. Soltner, B. Kabius, U. Poppe, and K. Urban, Physica C 182, 163 (1991). phc PHYCE6 0921-4534
19. N. D. Browning, J. P. Buban, P. D. Nellist, D. P. Norton, M. F. Chisholm, and S. J. Pennycook, Physica C 294, 183 (1998). phc PHYCE6 0921-4534
20. H. Hilgenkamp and J. Mannhart, Appl. Phys. Lett. 73, 265 (1998). apl APPLAB 0003-6951
21. Y. Soutome, R. Hanson, T. Fukazawa, K. Saitoh, A. Tsukamoto, Y. Tarutani, and K. Takagi, IEEE Trans. Appl. Supercond. 11, 163 (2001). tas ITASE9 1051-8223