Magnetic detection of photogenerated currents in semiconductor wafers using superconducting quantum interference devices

Applied Physics Letters

Volumn 74, Issue 19, 1999, Pages 2863-2865

  Beyer, J ^a   Matz, H ^a   Drung, D ^a   Schurig, Th ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CRYSTAL GROWTH FROM MELT; MAGNETOMETERS; NONDESTRUCTIVE EXAMINATION; PHOTOCURRENTS; RELAXATION PROCESSES; SEMICONDUCTOR DOPING; SEMICONDUCTOR GROWTH; SINGLE CRYSTALS; SQUIDS;

GROWTH-RELATED DOPING FLUCTUATIONS; SPATIALLY RESOLVING SCANNING MEASUREMENT;

SILICON WAFERS;

EID: 0032613710     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124039     Document Type: Article

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