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Volumn 44, Issue 42-45, 2005, Pages

Mobility enhancement in strained Ge heterostructures by planarization of SiGe buffer layers grown on Si substrates

Author keywords

CMP; SiGe; Strained Ge

Indexed keywords

CHEMICAL MECHANICAL POLISHING; GERMANIUM; HOLE MOBILITY; SEMICONDUCTOR DOPING; SILICON; SURFACE ROUGHNESS;

EID: 30344452612     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.44.L1320     Document Type: Article
Times cited : (16)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.