Mott-hopping processes in neodymium oxide thin films prepared on Si(100) substrates

Crystal Research and Technology

Volumn 39, Issue 5, 2004, Pages 404-407

  Dakhel, A A ^a  

^a UNIVERSITY OF BAHRAIN   (Bahrain)

Author keywords

Dielectric phenomena; Insulating films; Mott VRH; Neodymium oxide

Indexed keywords

ANNEALING; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; DIFFUSION; MOS DEVICES; NEODYMIUM COMPOUNDS; SILICON WAFERS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

HYGROSCOPY; RARE EARTH OXIDES (REO); VARIABLE-RANGE HOPPING (VRH);

SILICON;

EID: 2942544344     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/crat.200310202     Document Type: Article

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