Scanning tunneling microscopy and spectroscopy of reconstructed Si(100) surfaces

Physical Review B - Condensed Matter and Materials Physics

Volumn 71, Issue 16, 2005, Pages

  Dubois, M ^a   Perdigao L ^a   Delerue, C ^a   Allan, G ^a   Grandidier, B ^a   Deresmes, D ^a   Stievenard D ^a  

^a INSTITUT D ELECTRONIQUE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 28744450054     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.165322     Document Type: Article

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