Evidence of asymmetric dimers down to 40 K at the clean Si(100) surface

Physical Review B - Condensed Matter and Materials Physics

Volumn 66, Issue 15, 2002, Pages 1533171-1533174

  Le Lay, G ^a,b   Cricenti, A ^c   Ottaviani, C ^c   Perfetti, P ^c   Tanikawa, T ^d   Matsuda, I ^d   Hasegawa, S ^d  

^a CAMPUS DE LUMINY   (France)

^b AIX MARSEILLE UNIVERSITY   (France)

^c CNR   (Italy)

^d UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FERROMAGNETIC MATERIAL; SILICON;

ARTICLE; LOW TEMPERATURE; MATERIALS; MATERIALS TESTING; PHYSICS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR; SURFACE PROPERTY; SYNCHROTRON RADIATION;

EID: 13944255165     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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