Unexpected factor in testing for CMOS opens: the die surface

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1996, Pages 422-429

  Konuk, Haluk ^a   Ferguson, F Joel ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC WIRING; GATES (TRANSISTOR); INTEGRATED CIRCUIT MANUFACTURE; MATHEMATICAL MODELS; SURFACE PHENOMENA; VOLTAGE MEASUREMENT;

CMOS OPEN; DIE SURFACE; FLOATING GATES; SURFACE CONDUCTION; TRAPPED CHARGE MEASUREMENT;

INTEGRATED CIRCUIT TESTING;

EID: 0029694994     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)