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Applied Surface Science

Volumn 252, Issue 5, 2005, Pages 1846-1853

Thermal stability of W 2 B and W 2 B 5 contacts on ZnO

(8) Ip, K a Khanna, Rohit a Norton, D P a Pearton, S J a Ren, F a Kravchenko, I b Kao, C J c Chi, G C c

a J Crayton Pruitt Family Department of Biomedical Engineering (United States)

b University of Florida (United States)

c NATIONAL CENTRAL UNIVERSITY (Taiwan)

Author keywords

Auger electron spectroscopy; Scanning electron microscopy; Schottky barrier height

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; DIFFUSION; METALLIZING; SCANNING ELECTRON MICROSCOPY; THERMODYNAMIC STABILITY;

METAL SHEET RESISTANCE; SCHOTTKY BARRIER HEIGHT;

ZINC OXIDE;

EID: 27944474364 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2005.03.133 Document Type: Article

Times cited : (14)

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