Influence of leakage reduction techniques on delay/leakage uncertainty

Proceedings of the IEEE International Conference on VLSI Design

Volumn , Issue , 2005, Pages 374-379

  Tsai, Yuh Fang ^a   Vijaykrishnan, N ^a   Xie, Yuan ^a   Irwin, Mary Jane ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LEAKAGE REDUCTION TECHNIQUES; LEAKAGE UNCERTAINTY; MONTE-CARLO ANALYSIS;

MONTE CARLO METHODS; PROCESS ENGINEERING; TEMPERATURE MEASUREMENT; UNCERTAIN SYSTEMS;

LEAKAGE CURRENTS;

EID: 27944460390     PISSN: 10639667     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

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