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Volumn , Issue , 2003, Pages 285-288

Yield optimization with energy-delay constraints in low-power digital circuits

Author keywords

[No Author keywords available]

Indexed keywords

DELAY CIRCUITS; DESIGN; ELECTRIC NETWORK ANALYSIS; ELECTRON DEVICES; INTEGRATED CIRCUIT MANUFACTURE; PARAMETRIC DEVICES; SOLID STATE DEVICES; THRESHOLD VOLTAGE;

EID: 14844302557     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EDSSC.2003.1283533     Document Type: Conference Paper
Times cited : (14)

References (7)
  • 1
    • 84950107446 scopus 로고    scopus 로고
    • Design for variability in DSM technologies
    • S. R. Nassif, "Design for variability in DSM technologies," ISQED 2000, pp. 451-454, 2000.
    • (2000) ISQED 2000 , pp. 451-454
    • Nassif, S.R.1
  • 2
    • 0031342511 scopus 로고    scopus 로고
    • The impact of intra-die device parameter variations on path delays and on the design for yield of low voltage digital circuits
    • Dec.
    • Martin Eisele, et al., "The impact of intra-die device parameter variations on path delays and on the design for yield of low voltage digital circuits," IEEE Tran. on VLSI, vol. 5, no.4, pp.360-368, Dec. 1997.
    • (1997) IEEE Tran. on VLSI , vol.5 , Issue.4 , pp. 360-368
    • Eisele, M.1
  • 3
    • 0036916414 scopus 로고    scopus 로고
    • Methods for true power minimization
    • R. W. Brodersen, et al., "Methods for true power minimization," ICCAD, pp. 35-42, 2002.
    • (2002) ICCAD , pp. 35-42
    • Brodersen, R.W.1
  • 4
    • 84949480508 scopus 로고    scopus 로고
    • Design sensitivities to variability: Extrapolations and assessments in nanometer VLSI
    • Sep.
    • Y. Cao, et al., "Design sensitivities to variability: extrapolations and assessments in nanometer VLSI," IEEE ASIC/SoC, pp. 411-415, Sep. 2002.
    • (2002) IEEE ASIC/SoC , pp. 411-415
    • Cao, Y.1
  • 5
    • 0031121270 scopus 로고    scopus 로고
    • Technology challenges for integration near and below 0.1μm
    • Apr.
    • S. Asai and Y. Wada, "Technology challenges for integration near and below 0.1μm," Proc. of IEEE, vol. 85, no. 4, pp. 505-520, Apr. 1997.
    • (1997) Proc. of IEEE , vol.85 , Issue.4 , pp. 505-520
    • Asai, S.1    Wada, Y.2
  • 7
    • 0025953236 scopus 로고
    • Optimum buffer circuits for driving long uniform lines
    • Jan.
    • S. Dhar, and M. A. Franklin, "Optimum buffer circuits for driving long uniform lines," JSSC, vol. 26, no. 1, pp. 32-40, Jan. 1991.
    • (1991) JSSC , vol.26 , Issue.1 , pp. 32-40
    • Dhar, S.1    Franklin, M.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.