Design and performance of the ABCD3TA ASIC for readout of silicon strip detectors in the ATLAS semiconductor tracker
(203)
Campabadal, F
a
Fleta, C
a
Key, M
a
Lozano, M
a
Martinez, C
a
Pellegrini, G
a
Rafi, J M
a
Ullan, M
a
Johansen, L G
b
Mohn, B
b
Oye, O
b
Solberg, A O
b
Stugu, B
b
Ciocio, A
c
Ely, R
c
Fadeyev, V
c
Gilchriese, M
c
Haber, C
c
Siegrist, J
c
Spieler, H
c
Vu, C
c
Bell, P J
d
Charlton, D G
d
Dowell, J D
d
Gallop, B J
d
Homer, R J
d
Jovanovic, P
d
Mahout, G
d
McMahon, T J
d
Wilson, J A
d
Barr, A J
e
Carter, J R
e
Goodrick, M J
e
Hill, J C
e
Lester, C G
e
Parker, M A
e
Robinson, D
e
Anghinolfi, F
f
Chesi, E
f
Jarron, P
f
Kaplon, J
f
Macpherson, A
f
Pernegger, H
f
Pritchard, T
f
Roe, S
f
Rudge, A
f
Weilhammer, P
f
Bialas, W
g
Dabrowski, W
g
Dwuznik, M
g
Toczek, B
g
Koperny, S
g
Bruckman, P
h
Gadomski, S
h
Gornicki, E
h
Malecki, P
h
Moszczynski, A
h
Stanecka, E
h
Szczygiel, R
h
Turala, M
h
Wolter, M
h
Feld, L
i
Ketterer, C
i
Ludwigf, J
i
Meinhardt, J
i
Runge, K
i
Clark, A G
j
Donega, M
j
D'Onofrio, M
j
Ferrere, D
j
La Marra, D
j
Macina, D
j
Mangin Brinet, M
j
Mikulec, B
j
Zsenei, A
j
Bates, R L
k
Cheplakov, A
k
Iwata, Y
l
Ohsugi, T
l
Ikegami, Y
m
Kohriki, T
m
Kondo, T
m
Terada, S
m
Ujiie, N
m
Unno, Y
m
Takashima, R
n
Allport, P P
o
Greenall, A
o
Jackson, J N
o
Jones, T J
o
Smith, N A
o
Beck, G A
p
Carter, A A
p
Morris, J
p
Morin, J
p
Cindro, V
q
Kramberger, G
q
Mandic I
q
Mikuz M
q
Duerdoth, I P
r
Foster, J M
r
Pater, J
r
Snow, S W
r
Thompson, R J
r
Atkinson, T M
s
Dick, B
s
Fares, F
s
Moorhead, G F
s
Taylor, G N
s
Andricek, L
t
Bethke, S
t
Hauf, D
t
Kudlaty, J
t
Lutz, G
t
Moser, H G
t
Nisius, R
t
Richter, R
t
Schieck, J
t
Colijn, A P
u
Cornelissen, T
u
Gorfine, G W
u
Hartjes, F G
u
Hessey, N P
u
de Jong, P
u
Kluit, R
u
Koffeman, E
u
Muijs, A J M
u
Peeters, S J M
u
van Eijk, B
u
Nakano, I
v
Tanaka, R
v
Dorholt, O
w
Danielsen, K M
w
Huse, T
w
Sandaker, H
w
Stapnes, S
w
Kundu, N
x
Nickerson, R B
x
Weidberg, A
x
Bohm, J
y
Mikestikova, M
y
Stastny, J
y
Broklova, Z
z
Broz, J
z
Dolezal, Z
z
Kodys, P
z
Kubik, P
z
Reznicek, P
z
Vorobel, V
z
Wilhelm, I
z
Cermak P
aa
Chren, D
aa
Horazdovsky T
aa
Linhart, V
aa
Pospisil S
aa
Sinor, M
aa
Solar, M
aa
Sopko, B
aa
Stekl, I
aa
Apsimon, R J
ab
Batchelor, L E
ab
Bizzell, J P
ab
Falconer, N G
ab
French, M J
ab
Gibson, M D
ab
Haywood, S J
ab
Matson, R M
ab
McMahon, S J
ab
Morrissey, M
ab
Murray, W J
ab
Phillips, P W
ab
Tyndel, M
ab
Villani, E G
ab
Cosgrove, D P
ac
Dorfan, D E
ac
Grillo, A A
ac
Kachiguine, S
ac
Rosenbaum, F
ac
Sadrozinski, H F W
ac
Seiden, A
ac
Spencer, E
ac
Wilder, M
ac
Akimoto, T
ad
Hara, K
ad
Tanizaki, K
ad
Bingefors, N
ae
Brenner, R
ae
Ekelop, T
ae
Eklund, L
ae
Bernabeu, J
af
Civera, J V
af
Costa, M J
af
Fuster, J
af
Garcia, C
af
Garcia Navarro, J E
af
Gonzalez Sevilla, S
af
Lacasta, C
af
Llosa, G
af
Marti Garcia, S
af
Modesto, P
af
Sanchez, F J
af
Sospedra, L
af
Vos, M
af
more..
|
-
1
-
-
0003611404
-
-
CERN/LHCC/97-17, ATLAS TDR 5 30 April
-
ATLAS Inner Detector Technical Design Report, CERN/LHCC/97-17, ATLAS TDR 5, vol. 2, 30 April 1997, pp. 427-439.
-
(1997)
ATLAS Inner Detector Technical Design Report
, vol.2
, pp. 427-439
-
-
-
2
-
-
0011182821
-
The development of the CAFE-P/CAFE-M bipolar chips for the ATLAS Semiconductor Tracker
-
(CERN 99-09 - CERN/LHCC/99-33), CERN
-
T. Dubbs, et al., The development of the CAFE-P/CAFE-M bipolar chips for the ATLAS Semiconductor Tracker, in: Proceedings of the Fifth Workshop on Electronics for LHC Experiments (CERN 99-09 - CERN/LHCC/99-33), CERN, 1999, pp. 123-127.
-
(1999)
Proceedings of the Fifth Workshop on Electronics for LHC Experiments
, pp. 123-127
-
-
Dubbs, T.1
-
3
-
-
26944491216
-
The development of a rad-hard CMOS chip for the binary readout of the ATLAS Semiconductor Tracker
-
(CERN 99-09 - CERN/LHCC/99-33), CERN
-
D. Campbell, et al., The development of a rad-hard CMOS chip for the binary readout of the ATLAS Semiconductor Tracker, in: Proceedings of the Fifth Workshop on Electronics for LHC Experiments (CERN 99-09 - CERN/LHCC/99-33), CERN, 1999, pp. 15-26.
-
(1999)
Proceedings of the Fifth Workshop on Electronics for LHC Experiments
, pp. 15-26
-
-
Campbell, D.1
-
4
-
-
0005129233
-
DMILL, a mixed analog-digital radiation-hard technology for high energy physics electronics
-
CERN/LHCC/97-15, CERN
-
DMILL, a Mixed Analog-Digital Radiation-Hard Technology for High Energy Physics Electronics, RD29 Status Report, CERN/LHCC/97-15, CERN, 1997.
-
(1997)
RD29 Status Report
-
-
-
6
-
-
0000462040
-
Progress in Development of the Readout chip for ATLAS Semiconductor Tracker
-
(CERN 2000-010 - CERN/LHCC/2000-041), CERN
-
W. Dabrowski, et al., Progress in Development of the Readout chip for ATLAS Semiconductor Tracker, in: Proceedings of the Sixth Workshop on Electronics for LHC Experiment (CERN 2000-010 - CERN/LHCC/2000-041), CERN, 2000, pp. 115-119.
-
(2000)
Proceedings of the Sixth Workshop on Electronics for LHC Experiment
, pp. 115-119
-
-
Dabrowski, W.1
-
9
-
-
0342701600
-
Development of front-end electronics for silicon strip detectors using the DMILL BiCMOS rad-hard process
-
(CERN/LHCC/96-39), CERN
-
F. Anghinolfi, et al., Development of Front-End Electronics for Silicon Strip Detectors Using the DMILL BiCMOS Rad-Hard Process, in: Proceedings of the Second Workshop on Electronics for LHC Experiments (CERN/LHCC/96-39), CERN, 1996, pp. 483-487.
-
(1996)
Proceedings of the Second Workshop on Electronics for LHC Experiments
, pp. 483-487
-
-
Anghinolfi, F.1
-
26
-
-
0005493513
-
Minimizing dosimetry errors in radiation hardness testing of silicon electronic devices using Co-60 sources
-
American Society For Testing And Materials (ASTM), E 1249-93
-
Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources, Annual Book Of ASTM Standards, American Society For Testing And Materials (ASTM), E 1249-93, 1993.
-
(1993)
Annual Book of ASTM Standards
-
-
-
27
-
-
0011182825
-
Standard guide for ionizing radiation (total dose) effects testing of semiconductor devices
-
American Society For Testing And Materials (ASTM), F 1892-98
-
Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices, Annual Book Of ASTM Standards, American Society For Testing And Materials (ASTM), F 1892-98, 1998.
-
(1998)
Annual Book of ASTM Standards
-
-
-
28
-
-
0005508874
-
Application of thermoluminiscence-dosimetry (TLD) systems for determining absorbed dose in radiation-hardness testing of electronic devices
-
American Society For Testing And Materials (ASTM), E668-97
-
Application of Thermoluminiscence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices, Annual Book Of ASTM Standards, American Society For Testing And Materials (ASTM), E668-97, 1997.
-
(1997)
Annual Book of ASTM Standards
-
-
|