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Volumn 552, Issue 3, 2005, Pages 292-328

Design and performance of the ABCD3TA ASIC for readout of silicon strip detectors in the ATLAS semiconductor tracker

(203)  Campabadal, F a   Fleta, C a   Key, M a   Lozano, M a   Martinez, C a   Pellegrini, G a   Rafi, J M a   Ullan, M a   Johansen, L G b   Mohn, B b   Oye, O b   Solberg, A O b   Stugu, B b   Ciocio, A c   Ely, R c   Fadeyev, V c   Gilchriese, M c   Haber, C c   Siegrist, J c   Spieler, H c   more..


Author keywords

Application specific integrated circuits; Binary readout; Front end electronics; Quality assurance; Radiation damage; Silicon strip detectors; Tracking detectors

Indexed keywords

BINARY READOUTS; FRON-END ELECTRONICS; RADIATION DAMAGES; SILICON STRIP DETECTORS; TRACKING DETECTORS;

EID: 26944488320     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.07.002     Document Type: Article
Times cited : (135)

References (31)
  • 1
    • 0003611404 scopus 로고    scopus 로고
    • CERN/LHCC/97-17, ATLAS TDR 5 30 April
    • ATLAS Inner Detector Technical Design Report, CERN/LHCC/97-17, ATLAS TDR 5, vol. 2, 30 April 1997, pp. 427-439.
    • (1997) ATLAS Inner Detector Technical Design Report , vol.2 , pp. 427-439
  • 2
    • 0011182821 scopus 로고    scopus 로고
    • The development of the CAFE-P/CAFE-M bipolar chips for the ATLAS Semiconductor Tracker
    • (CERN 99-09 - CERN/LHCC/99-33), CERN
    • T. Dubbs, et al., The development of the CAFE-P/CAFE-M bipolar chips for the ATLAS Semiconductor Tracker, in: Proceedings of the Fifth Workshop on Electronics for LHC Experiments (CERN 99-09 - CERN/LHCC/99-33), CERN, 1999, pp. 123-127.
    • (1999) Proceedings of the Fifth Workshop on Electronics for LHC Experiments , pp. 123-127
    • Dubbs, T.1
  • 3
    • 26944491216 scopus 로고    scopus 로고
    • The development of a rad-hard CMOS chip for the binary readout of the ATLAS Semiconductor Tracker
    • (CERN 99-09 - CERN/LHCC/99-33), CERN
    • D. Campbell, et al., The development of a rad-hard CMOS chip for the binary readout of the ATLAS Semiconductor Tracker, in: Proceedings of the Fifth Workshop on Electronics for LHC Experiments (CERN 99-09 - CERN/LHCC/99-33), CERN, 1999, pp. 15-26.
    • (1999) Proceedings of the Fifth Workshop on Electronics for LHC Experiments , pp. 15-26
    • Campbell, D.1
  • 4
    • 0005129233 scopus 로고    scopus 로고
    • DMILL, a mixed analog-digital radiation-hard technology for high energy physics electronics
    • CERN/LHCC/97-15, CERN
    • DMILL, a Mixed Analog-Digital Radiation-Hard Technology for High Energy Physics Electronics, RD29 Status Report, CERN/LHCC/97-15, CERN, 1997.
    • (1997) RD29 Status Report
  • 6
    • 0000462040 scopus 로고    scopus 로고
    • Progress in Development of the Readout chip for ATLAS Semiconductor Tracker
    • (CERN 2000-010 - CERN/LHCC/2000-041), CERN
    • W. Dabrowski, et al., Progress in Development of the Readout chip for ATLAS Semiconductor Tracker, in: Proceedings of the Sixth Workshop on Electronics for LHC Experiment (CERN 2000-010 - CERN/LHCC/2000-041), CERN, 2000, pp. 115-119.
    • (2000) Proceedings of the Sixth Workshop on Electronics for LHC Experiment , pp. 115-119
    • Dabrowski, W.1
  • 9
    • 0342701600 scopus 로고    scopus 로고
    • Development of front-end electronics for silicon strip detectors using the DMILL BiCMOS rad-hard process
    • (CERN/LHCC/96-39), CERN
    • F. Anghinolfi, et al., Development of Front-End Electronics for Silicon Strip Detectors Using the DMILL BiCMOS Rad-Hard Process, in: Proceedings of the Second Workshop on Electronics for LHC Experiments (CERN/LHCC/96-39), CERN, 1996, pp. 483-487.
    • (1996) Proceedings of the Second Workshop on Electronics for LHC Experiments , pp. 483-487
    • Anghinolfi, F.1
  • 26
    • 0005493513 scopus 로고
    • Minimizing dosimetry errors in radiation hardness testing of silicon electronic devices using Co-60 sources
    • American Society For Testing And Materials (ASTM), E 1249-93
    • Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources, Annual Book Of ASTM Standards, American Society For Testing And Materials (ASTM), E 1249-93, 1993.
    • (1993) Annual Book of ASTM Standards
  • 27
    • 0011182825 scopus 로고    scopus 로고
    • Standard guide for ionizing radiation (total dose) effects testing of semiconductor devices
    • American Society For Testing And Materials (ASTM), F 1892-98
    • Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices, Annual Book Of ASTM Standards, American Society For Testing And Materials (ASTM), F 1892-98, 1998.
    • (1998) Annual Book of ASTM Standards
  • 28
    • 0005508874 scopus 로고    scopus 로고
    • Application of thermoluminiscence-dosimetry (TLD) systems for determining absorbed dose in radiation-hardness testing of electronic devices
    • American Society For Testing And Materials (ASTM), E668-97
    • Application of Thermoluminiscence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices, Annual Book Of ASTM Standards, American Society For Testing And Materials (ASTM), E668-97, 1997.
    • (1997) Annual Book of ASTM Standards


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.