Beamtest of nonirradiated and irradiated ATLAS SCT microstrip modules at KEK

IEEE Transactions on Nuclear Science

Volumn 49 I, Issue 4, 2002, Pages 1868-1875

  Unno, Y ^a   Matuo, T ^b   Hashizaki, T ^b   Akimoto, T ^c   Bernabeu, J ^d   Dolezal, Z ^e   Eklund, L ^f   Hara, K ^c   Ikegami, Y ^a   Iwata, Y ^g   Kato, Y ^c   Ketterer, C ^h   Kobayashi, H ^c   Kohriki, T ^a   Kondo, T ^a   Koshino, T ^b   Ludwig, J ^h   Masuda, T ^g   Moorhead, G ⁱ   Nakano, I ^b   Norimatsu, K ^b   Ohsugi, T ^g   Runge, K ^h   Shinma, S ^c   Takashima, R ^j   Tanaka, R ^b   Tanimoto, N ^b   Terada, S ^a   Ujiie, N ^a   Vos, M ^d   Yamanaka, K ^g   Yamashita, T ^b   more..

^a INSTITUTE OF PARTICLE AND NUCLEAR STUDIES   (Japan)

^b OKAYAMA UNIVERSITY   (Japan)

^c UNIVERSITY OF TSUKUBA   (Japan)

^d UNIVERSITY OF VALENCIA   (Spain)

^e CHARLES UNIVERSITY   (Czech Republic)

^f UPPSALA UNIVERSITY   (Sweden)

^g HIROSHIMA UNIVERSITY   (Japan)

^h UNIVERSITY OF FREIBURG   (Germany)

ⁱ UNIVERSITY OF MELBOURNE   (Australia)

^j KYOTO UNIVERSITY OF EDUCATION   (Japan)

more..

Author keywords

Radiation damage effects; Silicon microstrip radiation detectors

Indexed keywords

MICROSTRIP DEVICES; RADIATION DAMAGE; RADIATION DETECTORS; SIGNAL TO NOISE RATIO; SPURIOUS SIGNAL NOISE;

SILICON MICROSTRIP (SCT) MODULES;

SILICON;

EID: 0036703078     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.801505     Document Type: Article

References (10)

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10. T. Dubbs, S. Kashigin, M. Kratzer, W. Kroeger, T. Pulliam, and H.F.W. Sadrozinski et al., "Noise determination in silicon micro strips," IEEE Trans. Nucl. Sci., vol. 43, pp. 1119-1122, 1996.