SEU rate estimates for the ATLAS/SCT front-end ASIC

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 515, Issue 3, 2003, Pages 415-421

  Eklund, L ^a,b   Buttar, C ^c   Grigson, C ^c   Kramberger, G ^d   Mandic I ^d   Mikuz M ^d   Phillips, P ^e  

^a UPPSALA UNIVERSITY   (Sweden)

^b CERN   (Switzerland)

^c UNIVERSITY OF SHEFFIELD   (United Kingdom)

^d UNIVERSITY OF LJUBLJANA   (Slovenia)

^e RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

ATLAS; Radiation hardness; SEU; Silicon strip; Single event upset; Tracking

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; COLLIDING BEAM ACCELERATORS; DATA REDUCTION; IRRADIATION; PARTICLE BEAM TRACKING; PARTICLE DETECTORS; RADIATION HARDENING; SOFTWARE PROTOTYPING;

PROTOTYPE ELECTRONICS;

NUCLEAR INSTRUMENTATION;

EID: 0242522394     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2003.07.003     Document Type: Article

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