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Volumn 32, Issue 3, 2000, Pages 161-173
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Thermomechanical behavior of micron scale solder joints under dynamic loads
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Author keywords
[No Author keywords available]
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Indexed keywords
BOUNDARY CONDITIONS;
DYNAMIC LOADS;
ELASTICITY TESTING;
ELECTRODYNAMICS;
ELECTRONICS PACKAGING;
FATIGUE OF MATERIALS;
INTERFEROMETRY;
RELIABILITY;
SHOCK TESTING;
STRAIN;
THERMAL EFFECTS;
VIBRATIONS (MECHANICAL);
ELECTRODYNAMIC SHAKER;
INELASTIC STRAIN FIELD;
MOIRE INTERFEROMETRY;
THERMAL ENVIRONMENTAL CHAMBER;
THERMOMECHANICAL BEHAVIOR;
SOLDERED JOINTS;
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EID: 0034158821
PISSN: 01676636
EISSN: None
Source Type: Journal
DOI: 10.1016/S0167-6636(99)00053-8 Document Type: Article |
Times cited : (87)
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References (15)
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