메뉴 건너뛰기




Volumn 47, Issue 2-3, 2003, Pages 239-270

Fluid-dynamics during vapor epitaxy and modeling

Author keywords

A1. Fluid flows; A3. Chemical vapor deposition processes; B2. Semiconducting materials; Growth models; Multiscale modeling; Vapor phase epitaxy

Indexed keywords

CHEMICAL VAPOR DEPOSITION; FLOW OF FLUIDS; MICROELECTRONICS; OPTOELECTRONIC DEVICES; SEMICONDUCTOR MATERIALS; THICK FILMS; THIN FILMS; VAPOR PHASE EPITAXY;

EID: 23344451412     PISSN: 09608974     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.pcrysgrow.2005.02.002     Document Type: Review
Times cited : (18)

References (97)
  • 16
    • 18844364378 scopus 로고    scopus 로고
    • D. Crippa D.L. Rode M. Masi Academic Press San Diego, CA
    • M. Masi, and S. Kommu D. Crippa D.L. Rode M. Masi Silicon Epitaxy 2001 Academic Press San Diego, CA 185
    • (2001) Silicon Epitaxy , pp. 185
    • Masi, M.1    Kommu, S.2
  • 30
    • 18844365304 scopus 로고    scopus 로고
    • CFX, AEA Technology, Harwell UK, 〈www.aeat.com〉
  • 31
    • 18844452088 scopus 로고    scopus 로고
    • FEMLAB, Comsol Inc., Burlington MA, 〈www.comsol.com〉
  • 32
    • 18844386986 scopus 로고    scopus 로고
    • FIDAP. Fluent Inc., Evanston IL, 〈www.fluent.com〉
  • 33
    • 18844366337 scopus 로고    scopus 로고
    • FLUENT. Fluent Inc., Evanston IL, 〈www.fluent.com〉
  • 34
    • 18844462159 scopus 로고    scopus 로고
    • MP-SALSA. Sandia National Laboratories, Albuquerque NM, 〈www.sandia.com〉.
  • 35
    • 18844428259 scopus 로고    scopus 로고
    • PHOENICS-CVD. CHAM Ltd, Wimbledon UK, 〈www.cham.co.uk〉.
  • 36
    • 18844427209 scopus 로고    scopus 로고
    • STARCD, CD-Adapco Group, London UK, 〈www.cd-adapco.com〉.
  • 40
    • 18744438691 scopus 로고
    • Benchmarking computational fluid dynamics (CFD) codes for rapid thermal processing symulation
    • SEMATECH
    • F.T. Geyling, Benchmarking computational fluid dynamics (CFD) codes for rapid thermal processing symulation. Technical report 94012188A-ENG, SEMATECH (1994).
    • (1994) Technical Report 94012188A-ENG
    • Geyling, F.T.1
  • 50
    • 0039297003 scopus 로고    scopus 로고
    • T.M. Besmann M.D. Allendorf McD. Robinson R.K. Ulrich The Electrochemical Society Pennington, NJ
    • M. Masi, S. Fogliani, and S. Carrà T.M. Besmann M.D. Allendorf McD. Robinson R.K. Ulrich Chemical Vapor Deposition XIII 1996 The Electrochemical Society Pennington, NJ 125
    • (1996) Chemical Vapor Deposition XIII , pp. 125
    • Masi, M.1    Fogliani, S.2    Carrà, S.3
  • 57
    • 18844367351 scopus 로고    scopus 로고
    • AMPAC. Semichem, Shawnee Mission KS, 〈www.semichem.com〉.
  • 58
    • 18844378548 scopus 로고    scopus 로고
    • CERIUS2. Molecular Simulation Inc., San Diego CA, 〈www.msi. com〉.
  • 59
    • 18844392204 scopus 로고    scopus 로고
    • GAUSSIAN 98. Gaussian Inc., Carnegie PA, 〈www.gaussian.com〉.
    • GAUSSIAN , vol.98
  • 63
    • 18844364378 scopus 로고    scopus 로고
    • D. Crippa D.L. Rode M. Masi Academic Press San Diego, CA
    • C. Cavallotti, and M. Masi D. Crippa D.L. Rode M. Masi Silicon Epitaxy 2001 Academic Press San Diego, CA 51
    • (2001) Silicon Epitaxy , pp. 51
    • Cavallotti, C.1    Masi, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.