High-resolution flash time-to-digital conversion and calibration for system-on-chip testing

IEE Proceedings: Computers and Digital Techniques

Volumn 152, Issue 3, 2005, Pages 415-426

  Levine, P M ^a   Roberts, G W ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; CMOS INTEGRATED CIRCUITS; ERROR ANALYSIS; FLIP FLOP CIRCUITS; MATHEMATICAL MODELS; RANDOM PROCESSES; TESTING; VLSI CIRCUITS;

CMOS TECHNOLOGY; FLIP-FLOP TEMPORAL OFFSETS; TIME INTERVAL; TIME-TO-DIGITAL CONVERTERS;

MICROPROCESSOR CHIPS;

EID: 22944466072     PISSN: 13502387     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1049/ip-cdt:20045063     Document Type: Conference Paper

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