Stand-alone integrated test core for time and frequency domain measurements

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 1031-1040

  Hafed, Mohamed ^a   Abaskharoun, Nazmy ^a   Roberts, Gordon W ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; DIGITAL SIGNAL PROCESSING; ELECTRIC WAVEFORMS; FREQUENCY DOMAIN ANALYSIS; INTEGRATED CIRCUIT LAYOUT; NAND CIRCUITS; SPECTRUM ANALYSIS; TIME DOMAIN ANALYSIS;

BAND LIMITED WAVEFORMS; INTEGRATED TEST CORE; MIXED SIGNAL CIRCUIT;

INTEGRATED CIRCUIT TESTING;

EID: 0034482667     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)