On-chip picosecond time measurement

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue , 2000, Pages 52-53

  Gutnik, Vadim ^a   Chandrakasan, Anantha ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; INTEGRATED CIRCUIT TESTING; MICROPROCESSOR CHIPS;

TIME TO DIGITAL CONVERTERS (TDC);

TIMING CIRCUITS;

EID: 0033698938     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)