Density comparisons of silicon samples by the pressure-of-flotation method at PTB

Metrologia

Volumn 41, Issue 2, 2004, Pages

  Bettin, H ^a   Toth, H ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY (SPECIFIC GRAVITY); DENSITY MEASUREMENT (SPECIFIC GRAVITY); ELLIPSOMETRY; FLOTATION; HYDROSTATIC PRESSURE; INTERFEROMETERS; LAGRANGE MULTIPLIERS; MEASUREMENT THEORY; POLYCRYSTALLINE MATERIALS; SINGLE CRYSTALS; STANDARDS; TRANSMISSION ELECTRON MICROSCOPY;

ARCHIMEDES' PRINCIPLE; CORRELATION COEFFICIENTS; PRESSURE-OF-FLOTATION; SILICON SINGLE CRYSTALS;

SILICON;

EID: 2342527153     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/41/2/S05     Document Type: Review

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