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Volumn 41, Issue 1, 2004, Pages 56-64
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Measurement repetitions of the Si(220) lattice spacing
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Author keywords
[No Author keywords available]
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Indexed keywords
LATTICE PLANES;
LATTICE SPACINGS;
CRYSTAL LATTICES;
CRYSTALS;
DIFFRACTION;
INTERFEROMETERS;
INTERFEROMETRY;
OPTICAL BEAM SPLITTERS;
PARTICLE BEAMS;
PHOTONS;
SILICON;
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EID: 1642619416
PISSN: 00261394
EISSN: None
Source Type: Journal
DOI: 10.1088/0026-1394/41/1/008 Document Type: Article |
Times cited : (33)
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References (26)
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