Intercomparison of silicon samples from the avogadro projects

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 2, 1997, Pages 551-555

  Kassler Jr , Ernest G ^a   Schweppe, John Edward ^a   Deslattes, Richard D ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPARATORS (OPTICAL); CRYSTAL LATTICES; INTERFEROMETERS; LATTICE CONSTANTS; OPTICAL INSTRUMENTS; SEMICONDUCTING SILICON;

AVOGADRO PROJECTS; LATTICE COMPARATORS;

CRYSTALLINE MATERIALS;

EID: 0031118987     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.571909     Document Type: Article

References (11)

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