Density comparison measurements of silicon crystals by a pressure-of-flotation method at NMIJ

Metrologia

Volumn 41, Issue 2, 2004, Pages

  Waseda, A ^a   Fujii, K ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DENSITY MEASUREMENT (SPECIFIC GRAVITY); DENSITY OF LIQUIDS; FLOTATION; GRAVITATIONAL EFFECTS; MEASUREMENT THEORY; SILICON;

AVOGADRO CONSTANT; LEAST-SQUARE ALGORITHMS; PRESSURE-OF-FLOAT METHOD (PFM); X-RAY CRYSTAL DENSITY (XRCD);

SINGLE CRYSTALS;

EID: 2342475790     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/41/2/S06     Document Type: Article

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