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Volumn 188-189, Issue 1-3 SPEC.ISS., 2004, Pages 351-357

Characterization of hard DC-sputtered Si-based TiN coatings: The effect of composition and ion bombardment

Author keywords

DC; Ion bombardment; TiN

Indexed keywords

CHARACTERIZATION; COMPOSITION; COMPRESSIVE STRESS; FILM GROWTH; HARDNESS; ION BOMBARDMENT; LATTICE CONSTANTS; NANOSTRUCTURED MATERIALS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON; SOLENOIDS; SPUTTERING; TITANIUM NITRIDE;

EID: 20044390924     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2004.08.020     Document Type: Article
Times cited : (40)

References (48)
  • 28
    • 14644401864 scopus 로고    scopus 로고
    • JCPDS, File 38-1420
    • JCPDS, File 38-1420.
  • 36
    • 0002173308 scopus 로고    scopus 로고
    • (and references therein)
    • L. Hultman Vacuum 57 2000 1 (and references therein)
    • (2000) Vacuum , vol.57 , pp. 1
    • Hultman, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.