-
1
-
-
0032206869
-
-
Alivisatos, A. P.; Barbara, P. F.; Castleman, A. W.; Chang, J.; Dixon, D. A.; Klein, M. L.; McLendon, G. L.; Miller, J. S.; Ratner, M. A.; Rossky, P. J.; Stupp, S. I.; Thompson, M. E. Adv. Mater. 1998, 10 (16), 1297.
-
(1998)
Adv. Mater.
, vol.10
, Issue.16
, pp. 1297
-
-
Alivisatos, A.P.1
Barbara, P.F.2
Castleman, A.W.3
Chang, J.4
Dixon, D.A.5
Klein, M.L.6
McLendon, G.L.7
Miller, J.S.8
Ratner, M.A.9
Rossky, P.J.10
Stupp, S.I.11
Thompson, M.E.12
-
3
-
-
0042344949
-
-
Adams, D. M.; Brus, L.; Chidsey, C. E. D.; Creager, S.; Creutz, C.; Kagan, C. R.; Kamat, P. V.; Lieberman, M.; Lindsay, S.; Marcus, R. A.; Metzger, R. M.; Michel-Beyerle, M. E.; Miller, J. R.; Newton, M. D.; Rolison, D. R.; Sankey, O.; Schanze, K. S.; Yardley, J.; Zhu, X. J. Phys. Chem. B 2003, 107, 6668.
-
(2003)
J. Phys. Chem. B
, vol.107
, pp. 6668
-
-
Adams, D.M.1
Brus, L.2
Chidsey, C.E.D.3
Creager, S.4
Creutz, C.5
Kagan, C.R.6
Kamat, P.V.7
Lieberman, M.8
Lindsay, S.9
Marcus, R.A.10
Metzger, R.M.11
Michel-Beyerle, M.E.12
Miller, J.R.13
Newton, M.D.14
Rolison, D.R.15
Sankey, O.16
Schanze, K.S.17
Yardley, J.18
Zhu, X.19
-
4
-
-
0141792919
-
-
Hsu, J. W. P.; Loo, Y. L.; Lang, D. V.; Rogers, J. A. J. Vac. Sci. Technol., B 2003, 21 (4), 1928.
-
(2003)
J. Vac. Sci. Technol., B
, vol.21
, Issue.4
, pp. 1928
-
-
Hsu, J.W.P.1
Loo, Y.L.2
Lang, D.V.3
Rogers, J.A.4
-
5
-
-
2442661583
-
-
Shen, Y.; Hosseini, A. R.; Wong, M. H.; Malliaras G. G. ChemPhysChem 2004, 5, 16.
-
(2004)
Chem Phys Chem
, vol.5
, pp. 16
-
-
Shen, Y.1
Hosseini, A.R.2
Wong, M.H.3
Malliaras, G.G.4
-
6
-
-
0000554856
-
-
Hirose, Y.; Kahn, A.; Aristov, V.; Soukiassian, P.; Bulovic, V.; Forrest, S. R. Phys. Rev. B 1996, 54, 13748.
-
(1996)
Phys. Rev. B
, vol.54
, pp. 13748
-
-
Hirose, Y.1
Kahn, A.2
Aristov, V.3
Soukiassian, P.4
Bulovic, V.5
Forrest, S.R.6
-
7
-
-
0001753097
-
-
Gal, D.; Sone, E.; Cohen, R.; Kodes, G.; Libman, J.; Shanzer, A.; Schock, H.-W.; Cahen, D. Proc.-Indian Acad. Sci., Chem. Sci. 1997, 109, 487.
-
(1997)
Proc.-indian Acad. Sci., Chem. Sci.
, vol.109
, pp. 487
-
-
Gal, D.1
Sone, E.2
Cohen, R.3
Kodes, G.4
Libman, J.5
Shanzer, A.6
Schock, H.-W.7
Cahen, D.8
-
8
-
-
0242386370
-
-
Kahn, A.; Koch, N.; Gao, W. J. Polym. Sci., Part B: Polym. Phys. 2003, 41 (21), 2529.
-
(2003)
J. Polym. Sci., Part B: Polym. Phys.
, vol.41
, Issue.21
, pp. 2529
-
-
Kahn, A.1
Koch, N.2
Gao, W.3
-
9
-
-
0035894206
-
-
Shen, C.; Kahn, A.; Schwartz, J. J. Appl. Phys. 2001, 90 (12), 6236.
-
(2001)
J. Appl. Phys.
, vol.90
, Issue.12
, pp. 6236
-
-
Shen, C.1
Kahn, A.2
Schwartz, J.3
-
10
-
-
0011336568
-
-
Ishii, H.; Sugiyama, K.; Ito, E.; Seki, K. Adv. Mater. 1999, 11, 605.
-
(1999)
Adv. Mater.
, vol.11
, pp. 605
-
-
Ishii, H.1
Sugiyama, K.2
Ito, E.3
Seki, K.4
-
11
-
-
0001405356
-
-
Gensterblum, G.; Hevesi, K.; Han, B.-Y.; Yu, L.-M.; Pireaux, J.-J.; Thiry, P. A.; Caudano, R.; Lucas, A.-A.; Bernaerts, D.; Amelinckx, S.; Van Tendeloo, G.; Bendele, G.; Buslaps, T.; Johnson, R. L.; Foss, M.; Feidenhans'l, R.; Le Lay, G. Phys. Rev. B 1994, 50 (16), 11981.
-
(1994)
Phys. Rev. B
, vol.50
, Issue.16
, pp. 11981
-
-
Gensterblum, G.1
Hevesi, K.2
Han, B.-Y.3
Yu, L.-M.4
Pireaux, J.-J.5
Thiry, P.A.6
Caudano, R.7
Lucas, A.-A.8
Bernaerts, D.9
Amelinckx, S.10
Van Tendeloo, G.11
Bendele, G.12
Buslaps, T.13
Johnson, R.L.14
Foss, M.15
Feidenhans'l, R.16
Le Lay, G.17
-
12
-
-
1542544990
-
-
de Boer, B.; Frank, M. M.; Chabal, Y. J.; Jiang, W.; Garfunkel, E.; Bao, Z. Langmuir 2004, 20, 1539.
-
(2004)
Langmuir
, vol.20
, pp. 1539
-
-
De Boer, B.1
Frank, M.M.2
Chabal, Y.J.3
Jiang, W.4
Garfunkel, E.5
Bao, Z.6
-
13
-
-
0034624790
-
-
Vilan, A.; Shanzer, A.; Cahen, D. Nature 2000, 404, 166.
-
(2000)
Nature
, vol.404
, pp. 166
-
-
Vilan, A.1
Shanzer, A.2
Cahen, D.3
-
14
-
-
0035819208
-
-
Wu, D. G.; Ghabboun, J.; Martin, J. M. L.; Cahen, D. J. Phys. Chem. B 2001, 105, 12011.
-
(2001)
J. Phys. Chem. B
, vol.105
, pp. 12011
-
-
Wu, D.G.1
Ghabboun, J.2
Martin, J.M.L.3
Cahen, D.4
-
15
-
-
0037450218
-
-
Salomon, A.; Berkovich, D.; Cahen, D. Appl. Phys. Lett. 2003, 82 (7), 1051.
-
(2003)
Appl. Phys. Lett.
, vol.82
, Issue.7
, pp. 1051
-
-
Salomon, A.1
Berkovich, D.2
Cahen, D.3
-
17
-
-
0036180508
-
-
Ashkenasy, G.; Cahen, D.; Cohen, R.; Shanzer, A.; Vilan, A. Acc. Chem. Res. 2002, 35, 121.
-
(2002)
Acc. Chem. Res.
, vol.35
, pp. 121
-
-
Ashkenasy, G.1
Cahen, D.2
Cohen, R.3
Shanzer, A.4
Vilan, A.5
-
18
-
-
11344290288
-
-
Haick, H.; Ambrico, M.; Ligonzo, T.; Cahen D. Adv. Mater. 2004, 16, 2145.
-
(2004)
Adv. Mater.
, vol.16
, pp. 2145
-
-
Haick, H.1
Ambrico, M.2
Ligonzo, T.3
Cahen, D.4
-
19
-
-
0038441896
-
-
Vilan, A.; Ghabboun, J.; Cahen, D. J. Phys. Chem. B 2003, 107, 6360.
-
(2003)
J. Phys. Chem. B
, vol.107
, pp. 6360
-
-
Vilan, A.1
Ghabboun, J.2
Cahen, D.3
-
20
-
-
13644276624
-
-
Haick, H.; Ghabboun, J.; Cahen, D. Appl. Phys. Lett. 2005, 86, 042113.
-
(2005)
Appl. Phys. Lett.
, vol.86
, pp. 042113
-
-
Haick, H.1
Ghabboun, J.2
Cahen, D.3
-
21
-
-
8344275249
-
-
Haick, H.; Ambrico, M.; Ghabboun, J.; Ligonzo, T.; Cahen, D. Phys. Chem. Chem. Phys. 2004, 6, 4538.
-
(2004)
Phys. Chem. Chem. Phys.
, vol.6
, pp. 4538
-
-
Haick, H.1
Ambrico, M.2
Ghabboun, J.3
Ligonzo, T.4
Cahen, D.5
-
22
-
-
0035867232
-
-
Carrara, M.; Nuesch, F.; Zuppiroli, L. Synth. Met. 2001, 121, 1633.
-
(2001)
Synth. Met.
, vol.121
, pp. 1633
-
-
Carrara, M.1
Nuesch, F.2
Zuppiroli, L.3
-
24
-
-
0033579113
-
-
Cohen, R.; Kronik, L.; Shanzer, A.; Cahen, D.; Liu, A.; Rosenwaks, Y.; Lorenz, K. K.; Ellis, A. B. J. Am. Chem. Soc. 1999, 121 (45), 10545.
-
(1999)
J. Am. Chem. Soc.
, vol.121
, Issue.45
, pp. 10545
-
-
Cohen, R.1
Kronik, L.2
Shanzer, A.3
Cahen, D.4
Liu, A.5
Rosenwaks, Y.6
Lorenz, K.K.7
Ellis, A.B.8
-
25
-
-
0030760359
-
-
Bruening, M.; Cohen, R.; Guillemoles, J. F.; Moav, T.; Libman, J.; Shanzer, A.; Cahen, D. J. Am. Chem. Soc. 1997, 119, 5720.
-
(1997)
J. Am. Chem. Soc.
, vol.119
, pp. 5720
-
-
Bruening, M.1
Cohen, R.2
Guillemoles, J.F.3
Moav, T.4
Libman, J.5
Shanzer, A.6
Cahen, D.7
-
29
-
-
19944413444
-
-
note
-
TOF-SIMS measurements show higher surface coverage with dC-X (75-85%) than with dS-X (40-45%) molecules on the n-GaAs substrate used here.
-
-
-
-
30
-
-
19944368887
-
-
note
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The plots do not cross the (0,0) point, something that cannot be explained by the different bond polarities (As-S, Ga-O) of the actual binding groups. It may be due to oxide and/or hydroxide binding (due to exposure to the ambient) to those surface atoms that are not involved in the molecular binding, namely, the Ga and the As ones, respectively. For example, one can argue that the (residual) As-O bond (after dC-X binding to Ga) is less polar than the Ga-0 one (after dS-X binding to As).
-
-
-
-
31
-
-
1642525987
-
-
Gershewitz, O.; Grinstein, M.; Sukenik, C. N.; Regev, K.; Ghabboun, J.; Cahen, D. J. Phys. Chem. B 2004, 108 (2), 664.
-
(2004)
J. Phys. Chem. B
, vol.108
, Issue.2
, pp. 664
-
-
Gershewitz, O.1
Grinstein, M.2
Sukenik, C.N.3
Regev, K.4
Ghabboun, J.5
Cahen, D.6
-
32
-
-
19944422887
-
-
note
-
Δø = Δχ if the band bending remains constant.
-
-
-
-
36
-
-
19944362302
-
-
note
-
These values can be compared with those found for Au/dC-X/ GaAs junctions, where the Au contacts were prepared by another soft contacting method, lift-off, float-on (LOFO), which gave γ = 0.1 and γ = 0.55 for n- andp-GaAs (cf. ref 19), and for Au/dC-XM-ZnO (LOFO) ones, which gave also γ = 0.55 (cf. ref 15). In all these cases, Δχ, the change in electron affinity upon molecule adsorption, was comparable to that obtained here with the dC-X molecules.
-
-
-
-
37
-
-
19944425624
-
-
J. Ph.D. Thesis, Weizmann Institute of Science
-
Ghabboun, J. Ph.D. Thesis, Weizmann Institute of Science, 2004.
-
(2004)
-
-
Ghabboun1
-
38
-
-
0242578240
-
-
Lebedev, M. V.; Mayer, T.; Jaegermann, W. Surf. Sci. 2003, 547, 171.
-
(2003)
Surf. Sci.
, vol.547
, pp. 171
-
-
Lebedev, M.V.1
Mayer, T.2
Jaegermann, W.3
-
39
-
-
0000311936
-
-
Bastide, S.; Butruille, R.; Cahen, D.; Dutta, A.; Libman, J.; Shanzer, A.; Sun, L.; Vilan, A. J. Phys. Chem. B 1997, 101, 2678.
-
(1997)
J. Phys. Chem. B
, vol.101
, pp. 2678
-
-
Bastide, S.1
Butruille, R.2
Cahen, D.3
Dutta, A.4
Libman, J.5
Shanzer, A.6
Sun, L.7
Vilan, A.8
-
40
-
-
0033321920
-
-
Ohgi, T.; Sheng, H.-Y.; Dong, Z.-C.; Nejoh, H. Surf. Sci. 1999, 442, 277.
-
(1999)
Surf. Sci.
, vol.442
, pp. 277
-
-
Ohgi, T.1
Sheng, H.-Y.2
Dong, Z.-C.3
Nejoh, H.4
-
41
-
-
0036630917
-
-
Erkoc, S.; Amirouche, L.; Rouaiguia, L. Int. J. Mod. Phys. C 2002, 13 (6), 759.
-
(2002)
Int. J. Mod. Phys. C
, vol.13
, Issue.6
, pp. 759
-
-
Erkoc, S.1
Amirouche, L.2
Rouaiguia, L.3
-
43
-
-
0039003030
-
-
Geib, K. M.; Shin, J.; Wilmsen, C. W. J. Vac. Sci. Technol., B 1990, 8 (4), 838.
-
(1990)
J. Vac. Sci. Technol., B
, vol.8
, Issue.4
, pp. 838
-
-
Geib, K.M.1
Shin, J.2
Wilmsen, C.W.3
-
46
-
-
19944384704
-
-
note
-
16) thiol monolayers were adsorbed on Au substrates and contacted by indirect evaporation of Au and Pd. The resulting junctions show ∼20% larger number of short-circuits for Au contacts than for Pd ones (cf. ref 20). This is explained by the different mechanism by which Pd grows on the molecules, which will limit metal penetration between the molecular chains. We attribute the higher probability of shorts with Au to the generation of conductive, metallic wires between the molecules' chains, in addition to the metals filling the larger pinholes that will be present in such films.
-
-
-
-
47
-
-
1642414710
-
-
Walker, A.; Tighe, T. B.; Cabarcos, O. M.; Reinard, M. D.; Haynie, B. C.; Uppili, S.; Winograd, N.; Allara, D. L. J. Am. Chem. Soc. 2004, 126, 3954.
-
(2004)
J. Am. Chem. Soc.
, vol.126
, pp. 3954
-
-
Walker, A.1
Tighe, T.B.2
Cabarcos, O.M.3
Reinard, M.D.4
Haynie, B.C.5
Uppili, S.6
Winograd, N.7
Allara, D.L.8
-
48
-
-
19944365342
-
-
note
-
Similar SEM experiments with Pd show no significant differences in terms of the metal film growth on the molecules, between those with dC-X binding groups and those with dS-X ones, a finding that is consistent with the two-dimensional growth of Pd (cf. refs 49 and 50 below).
-
-
-
-
50
-
-
0030130348
-
-
Schmidt, A. A.; Eggers, H.; Herwig, K.; Anton, R. Surf. Sci. 1996, 349, 301.
-
(1996)
Surf. Sci.
, vol.349
, pp. 301
-
-
Schmidt, A.A.1
Eggers, H.2
Herwig, K.3
Anton, R.4
-
51
-
-
0034264807
-
-
Wang, B.; Xiao, X.; Sheng, P. J. Vac. Sci. Technol., B 2000, 18 (5), 2351.
-
(2000)
J. Vac. Sci. Technol., B
, vol.18
, Issue.5
, pp. 2351
-
-
Wang, B.1
Xiao, X.2
Sheng, P.3
-
52
-
-
19944386057
-
-
note
-
In the absence of the chemical driving force that stabilizes the deposited Au atoms/clusters on the surface of the molecular film, small clusters on top of the monolayer become unstable. As a result, they diffuse, on the monolayer surface, and coalesce into larger, stable clusters, growing in and out of the pinholes. If these are sufficiently close together, these coalesce to form elongated Au islands.
-
-
-
-
55
-
-
0027646822
-
-
Sato, K.; Sakata, M.; Ikoma, H. Jpn. J. Appl. Phys. 1993, 32, 3354.
-
(1993)
Jpn. J. Appl. Phys.
, vol.32
, pp. 3354
-
-
Sato, K.1
Sakata, M.2
Ikoma, H.3
-
56
-
-
84982069733
-
-
Smoes, S.; Manday, F.; Vander Auwera-Manhieu, A.; Drowart, J. Bull. Soc. Chim. Belg. 1972, 81, 45.
-
(1972)
Bull. Soc. Chim. Belg.
, vol.81
, pp. 45
-
-
Smoes, S.1
Manday, F.2
Vander Auwera-Manhieu, A.3
Drowart, J.4
-
58
-
-
0010984652
-
-
Ranke, W.; Xing, Y. R.; Shen, G. D. Surf. Sci. 1982, 122 (2), 256.
-
(1982)
Surf. Sci.
, vol.122
, Issue.2
, pp. 256
-
-
Ranke, W.1
Xing, Y.R.2
Shen, G.D.3
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