Nonlinear optical spectroscopy of suboxides at oxidized Si(111) interfaces

Physical Review Letters

Volumn 93, Issue 9, 2004, Pages

  Bergfeld, S ^a,b,c   Braunschweig, B ^a,b   Daum, W ^a,b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

^c JET Lasersysteme GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; CRYSTAL ATOMIC STRUCTURE; CRYSTALLINE MATERIALS; ENERGY DISSIPATION; HYDROGEN; LASER BEAMS; OXIDATION; RESONANCE; SECOND HARMONIC GENERATION; SILICON; TENSORS; TRANSITION METALS;

NONLINEAR OPTICAL SPECTROSCOPY; ORGANIC SURFACES; SECOND-HARMONIC SURFACES; SILICON INTERFACES;

INTERFACES (MATERIALS);

EID: 19544370185     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.93.097402     Document Type: Article

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