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Physical Review B - Condensed Matter and Materials Physics

Volumn 66, Issue 3, 2002, Pages 333051-333054

Optical second-harmonic interferometric spectroscopy of Si(111)-SiO2 interface in the vicinity of E2 critical points

(4) Dolgova, T V a Fedyanin, A A a Aktsipetrov, O A a Marowsky, G b

a MOSCOW STATE UNIVERSITY (Russian Federation)

b LASER LABORATORIUM GÖTTINGEN E V (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON DERIVATIVE; SILICON DIOXIDE;

ANALYTIC METHOD; ARTICLE; ELECTRON; ENERGY; INTERFEROMETRY; PHOTON; SPECTROSCOPY;

EID: 0037101222 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.66.033305 Document Type: Article

Times cited : (14)

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