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Physical Review Letters

Volumn 79, Issue 16, 1997, Pages 3014-3017

Statistical Cross-Linking at the Si(111)/SiO2 interface

(3) Luh, D A a Miller, T a Chiang, T C a

a University of Illinois at Urbana Champaign (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3943105875 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.79.3014 Document Type: Article

Times cited : (74)

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