CodSim - A combined delay fault simulator

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn 2003-January, Issue , 2003, Pages 79-88

  Qiu, Wangqi ^a   Lu, Xiang ^a   Li, Zhuo ^a   Walker, D M H ^a   Shi, Weiping ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN FOR TESTABILITY; FAULT TOLERANCE;

CAPACITIVE COUPLINGS; DELAY DEFECTS; DELAY FAULT COVERAGE; DELAY FAULT MODELS; DELAY FAULTS; FAULT COVERAGES; PARAMETRIC PROCESS; RESISTIVE OPEN;

DEFECTS;

EID: 18144387551     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TSM.2005.1250098     Document Type: Conference Paper

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