PROBE: a PPSFP simulator for resistive bridging faults

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2000, Pages 105-110

  Lee, Chul Young ^a   Walker, D M H ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; GATES (TRANSISTOR); VLSI CIRCUITS;

PARALLEL PATTERN SINGLE FAULT PROPAGATION; PPSFP FOR RESISTANCE ORIENTED BRIDGE EVALUATION; RESISTIVE BRIDGING FAULTS;

INTEGRATED CIRCUIT TESTING;

EID: 0033731885     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (20)