Delay-fault testing and defects in deep sub-micron ICs - does critical resistance really mean anything?

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 95-104

  Moore, Will ^a   Gronthoud, Guido ^a   Baker, Keith ^a   Lousberg, Maurice ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CROSSTALK; ELECTRIC RESISTANCE; GATES (TRANSISTOR); LOGIC CIRCUITS;

DELAY FAULT TESTING; POWER RAIL COUPLING;

INTEGRATED CIRCUIT TESTING;

EID: 0034476291     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (25)